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Results:
1-10
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Results: 10
Authors:
Eiden-Assmann, S
Schneider, AM
Behrens, P
Engelhardt, G
Mandar, H
Felsche, J
Citation: S. Eiden-assmann et al., Silver hydro sodalite [Ag-3(H2O)(4)](2)[Al3Si3O12](2): Synthesis and structure determination by combination of X-ray Rietveld refinement, thermogravimetry, FT-IR, and H-1-MAS NMR spectroscopy, EUR J INORG, (6), 2001, pp. 1527-1534
Authors:
Kukli, K
Aarik, J
Aidla, A
Forsgren, K
Sundqvist, J
Harsta, A
Uustare, T
Mandar, H
Kiisler, AA
Citation: K. Kukli et al., Atomic layer deposition of tantalum oxide thin films from iodide precursor, CHEM MATER, 13(1), 2001, pp. 122-128
Authors:
Aarik, J
Karlis, J
Mandar, H
Uustare, T
Sammelselg, V
Citation: J. Aarik et al., Influence of structure development on atomic layer deposition of TiO2 thinfilms, APPL SURF S, 181(3-4), 2001, pp. 339-348
Authors:
Aarik, J
Aidla, A
Mandar, H
Uustare, T
Kukli, K
Schuisky, M
Citation: J. Aarik et al., Phase transformations in hafnium dioxide thin films grown by atomic layer deposition at high temperatures, APPL SURF S, 173(1-2), 2001, pp. 15-21
Authors:
Aarik, J
Aidla, A
Mandar, H
Uustare, T
Citation: J. Aarik et al., Atomic layer deposition of titanium dioxide from TiCl4 and H2O: investigation of growth mechanism, APPL SURF S, 172(1-2), 2001, pp. 148-158
Authors:
Aarik, J
Aidla, A
Mandar, H
Sammelselg, V
Citation: J. Aarik et al., Anomalous effect of temperature on atomic layer deposition of titanium dioxide, J CRYST GR, 220(4), 2000, pp. 531-537
Authors:
Aarik, J
Aidla, A
Mandar, H
Sammelselg, V
Uustare, T
Citation: J. Aarik et al., Texture development in nanocrystalline hafnium dioxide thin films grown byatomic layer deposition, J CRYST GR, 220(1-2), 2000, pp. 105-113
Authors:
Krustok, J
Raudoja, J
Krunks, M
Mandar, H
Collan, H
Citation: J. Krustok et al., Nature of the native deep localized defect recombination centers in the chalcopyrite and orthorhombic AgInS2, J APPL PHYS, 88(1), 2000, pp. 205-209
Authors:
Mandar, H
Felsche, J
Mikli, V
Vajakas, T
Citation: H. Mandar et al., AXES1.9: new tools for estimation of crystallite size and shape by Williamson-Hall analysis, J APPL CRYS, 32, 1999, pp. 345-350
Authors:
Suisalu, A
Aarik, J
Mandar, H
Sildos, I
Citation: A. Suisalu et al., Spectroscopic study of nanocrystalline TiO2 thin films grown by atomic layer deposition, THIN SOL FI, 336(1-2), 1998, pp. 295-298
Risultati:
1-10
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