Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-3
|
Results: 3
Application of deterministic logic BIST on industrial circuits
Authors:
Kiefer, G Vranken, H Marinissen, EJ Wunderlich, HJ
Citation:
G. Kiefer et al., Application of deterministic logic BIST on industrial circuits, J ELEC TEST, 17(3-4), 2001, pp. 351-362
Challenges in testing core-based system ICs
Authors:
Marinissen, EJ Zorian, Y
Citation:
Ej. Marinissen et Y. Zorian, Challenges in testing core-based system ICs, IEEE COMM M, 37(6), 1999, pp. 104-109
Testing embedded-core-based system chips
Authors:
Zorian, Y Marinissen, EJ Dey, S
Citation:
Y. Zorian et al., Testing embedded-core-based system chips, COMPUTER, 32(6), 1999, pp. 52
Risultati:
1-3
|