AAAAAA

   
Results: 1-25 | 26-26 |
Results: 26-26/26
Low interface trap density in rapid thermally annealed Al/SiNx : H/InP metal-insulator-semiconductor devices
Authors: Redondo, E Blanco, N Martil, I Gonzalez-Diaz, G
Citation: E. Redondo et al., Low interface trap density in rapid thermally annealed Al/SiNx : H/InP metal-insulator-semiconductor devices, APPL PHYS L, 74(7), 1999, pp. 991-993
Risultati: 1-25 | 26-26 |