Authors:
Sommerhalter, C
Sadewasser, S
Glatzel, T
Matthes, TW
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells, SURF SCI, 482, 2001, pp. 1362-1367
Authors:
Sommerhalter, C
Glatzel, T
Matthes, TW
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces, APPL SURF S, 157(4), 2000, pp. 263-268
Authors:
Sommerhalter, C
Matthes, TW
Boneberg, J
Lux-Steiner, CM
Leiderer, P
Citation: C. Sommerhalter et al., Investigation of accepters in p-type WS2 by standard and photo-assisted scanning tunneling microscopy spectroscopy, APPL SURF S, 145, 1999, pp. 564-569
Authors:
Sommerhalter, C
Matthes, TW
Glatzel, T
Jager-Waldau, A
Lux-Steiner, MC
Citation: C. Sommerhalter et al., High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy, APPL PHYS L, 75(2), 1999, pp. 286-288