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Citation: V. Zielasek et al., Surface stress-induced island shape transition in Si(001) homoepitaxy - art. no. 201320, PHYS REV B, 6420(20), 2001, pp. 1320

Authors: Maxson, JB Perkins, N Savage, DE Woll, AR Zhang, L Kuech, TF Lagally, MG

Citation: Jb. Maxson et al., Novel dark-field imaging of GaN {0001} surfaces with low-energy electron microscopy, SURF SCI, 464(2-3), 2000, pp. 217-222

Authors: Maxson, JB Savage, DE Liu, F Tromp, RM Reuter, MC Lagally, MG

Citation: Jb. Maxson et al., Thermal roughening of a thin film: A new type of roughening transition, PHYS REV L, 85(10), 2000, pp. 2152-2155