Authors: Lee, JH Yoon, HS Park, BS Meang, SJ Lee, CW Choi, HT Yun, CE Park, CS

Citation: Jh. Lee et al., Noise performance of pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistors with wide head T-shaped gate recessed by electron cyclotron resonance plasma etching, JPN J A P 1, 38(2A), 1999, pp. 654-657