Authors:
Pierson, JF
Kim, KS
Jolly, J
Mencaraglia, D
Citation: Jf. Pierson et al., Crystallization of n-doped amorphous silicon PECVD films: comparison between SPC and RTA methods, J NON-CRYST, 270(1-3), 2000, pp. 91-96
Authors:
Bruggemann, R
Kleider, JP
Longeaud, C
Mencaraglia, D
Guillet, J
Bouree, JE
Niikura, C
Citation: R. Bruggemann et al., Electronic properties of silicon thin films prepared by hot-wire chemical vapour deposition, J NON-CRYST, 266, 2000, pp. 258-262