Authors: Lombardi, F Metra, C

Citation: F. Lombardi et C. Metra, Defect-oriented diagnosis for very deep-submicron systems, IEEE DES T, 18(1), 2001, pp. 8-9

Authors: Metra, C Favalli, M Ricco, B

Citation: C. Metra et al., Signal coding and CMOS gates for combinational functional blocks of very deep submicron self-checking circuits, VLSI DESIGN, 11(1), 2000, pp. 23-34

Authors: Metra, C Lo, JC

Citation: C. Metra et Jc. Lo, Intermediacy prediction for high speed Berger code checkers, J ELEC TEST, 16(6), 2000, pp. 607-615

Authors: Favalli, M Metra, C

Citation: M. Favalli et C. Metra, Bridging faults in pipelined circuits, J ELEC TEST, 16(6), 2000, pp. 617-629

Authors: Metra, C Favalli, M Ricco, B

Citation: C. Metra et al., Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines, IEEE COMPUT, 49(6), 2000, pp. 560-574

Authors: Favalli, M Metra, C

Citation: M. Favalli et C. Metra, Bus crosstalk fault-detection capabilities of error-detecting codes for on-line testing, IEEE VLSI, 7(3), 1999, pp. 392-396