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Results: 1-7 |
Results: 7

Authors: Zeman, M Van Swaaij, RACMM Zuiddam, M Metselaar, JW Schropp, REI
Citation: M. Zeman et al., Effect of front and back contact roughness on optical properties of singlejunction a-Si : H solar cells, SOL EN MAT, 66(1-4), 2001, pp. 353-359

Authors: van Zutphen, AJMM Sutta, P Tichelaar, FD von Keitz, A Zeman, M Metselaar, JW
Citation: Ajmm. Van Zutphen et al., Structure of thin polycrystalline silicon films on ceramic substrates, J CRYST GR, 223(3), 2001, pp. 332-340

Authors: Meytin, MN Zeman, M Budaguan, BG Metselaar, JW
Citation: Mn. Meytin et al., Kinetics of light-induced degradation in a-Si : H films investigated by computer simulation, SEMICONDUCT, 34(6), 2000, pp. 717-722

Authors: van Swaaij, RACMM Girwar, BS Metselaar, JW
Citation: Racmm. Van Swaaij et al., Powder formation in germane-silane plasmas, J VAC SCI A, 18(5), 2000, pp. 2116-2121

Authors: van Swaaij, RACMM Zeman, M Korevaar, BA Smit, C Metselaar, JW van de Sanden, MCM
Citation: Racmm. Van Swaaij et al., Challenges in amorphous silicon solar cell technology, ACT PHYS SL, 50(5), 2000, pp. 559-570

Authors: van Swaaij, RACMM Nadazdy, V Zeman, M Pincik, E Metselaar, JW
Citation: Racmm. Van Swaaij et al., Defect re-distribution in amorphous silicon below equilibration temperature, J NON-CRYST, 266, 2000, pp. 553-557

Authors: Zeman, M van Swaaij, RACMM Metselaar, JW Schropp, REI
Citation: M. Zeman et al., Optical modeling of a-Si : H solar cells with rough interfaces: Effect of back contact and interface roughness, J APPL PHYS, 88(11), 2000, pp. 6436-6443
Risultati: 1-7 |