Authors:
Uedono, A
Hiketa, M
Tanigawa, S
Kitano, T
Kubota, T
Makabe, M
Suzuki, R
Ohdaira, T
Mikado, T
Citation: A. Uedono et al., Defects in p(+)-gate metal-oxide-semiconductor structures probed by monoenergetic positron beams, J APPL PHYS, 86(10), 1999, pp. 5385-5391
Authors:
Fujinami, M
Suzuki, R
Ohdaira, T
Mikado, T
Citation: M. Fujinami et al., Thermal evolution of defects in H-implanted Si studied by monoenergetic positrons, PHYS REV B, 58(19), 1998, pp. 12559-12562