Authors: Orisaka, S Minobe, T Uchihashi, T Sugawara, Y Morita, S

Citation: S. Orisaka et al., The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope, APPL SURF S, 140(3-4), 1999, pp. 243-246

Authors: Minobe, T Uchihashi, T Tsukamoto, T Orisaka, S Sugawara, Y Morita, S

Citation: T. Minobe et al., Distance dependence of noncontact-AFM image contrast on Si(111)root 3 X root 3-Ag structure, APPL SURF S, 140(3-4), 1999, pp. 298-303

Authors: Uchihashi, T Sugawara, Y Tsukamoto, T Minobe, T Orisaka, S Okada, T Morita, S

Citation: T. Uchihashi et al., Imaging of chemical reactivity and buckled dimers on Si(100)2 X 1 reconstructed surface with noncontact AFM, APPL SURF S, 140(3-4), 1999, pp. 304-308

Authors: Sugawara, Y Minobe, T Orisaka, S Uchihashi, T Tsukamoto, T Morita, S

Citation: Y. Sugawara et al., Non-contact AFM images measured on Si(111)root 3 x root 3-Ag and Ag(111) surfaces, SURF INT AN, 27(5-6), 1999, pp. 456-461