Authors: Majumder, SB Agrawal, DC Mohapatra, YN Katiyar, RS

Citation: Sb. Majumder et al., Fatigue and dielectric properties of undoped and Ce doped PZT thin films, INTEGR FERR, 29(1-2), 2000, pp. A63-A74

Authors: Giri, PK Mohapatra, YN

Citation: Pk. Giri et Yn. Mohapatra, Thermal stability of defect complexes due to high dose MeV implantation insilicon, MAT SCI E B, 71, 2000, pp. 327-332

Authors: Giri, PK Mohapatra, YN

Citation: Pk. Giri et Yn. Mohapatra, Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation, SEMIC SCI T, 15(10), 2000, pp. 985-991

Authors: Giri, PK Mohapatra, YN

Citation: Pk. Giri et Yn. Mohapatra, Capacitance transient spectroscopy models of coupled trapping kinetics among multiple defect states: Application to the study of trapping kinetics ofdefects in heavy-ion-damaged silicon, PHYS REV B, 62(4), 2000, pp. 2496-2504

Authors: Giri, PK Mohapatra, YN

Citation: Pk. Giri et Yn. Mohapatra, Evidence of metastability with athermal ionization from defect clusters inion-damaged silicon, PHYS REV B, 62(24), 2000, pp. 16561-16565

Authors: Majumder, SB Roy, B Agrawal, DC Mohapatra, YN

Citation: Sb. Majumder et al., Phase transformations in sol-gel prepared PZT and PLT thin films upon isothermal treatments at different temperatures, FERROELECTR, 225(1-4), 1999, pp. 1077-1084