Authors: Dalmer, M Vetter, U Restle, M Stotzler, A Hofsass, H Ronning, C Moodley, MK Bharuth-Ram, K

Citation: M. Dalmer et al., Combination of emission channeling, photoluminescence and Mossbauer spectroscopy to identify rare earth defect complexes in semiconductors, HYPER INTER, 121(1-8), 1999, pp. 347-352