Authors:
Fleischer, S
Surya, C
Hu, YF
Beling, CD
Fung, S
Smith, TL
Moulding, KM
Missous, M
Citation: S. Fleischer et al., A study of the vacancy-defect distribution in a GaAs/AlxGa1-xAs multi-layer structure grown at low temperature, J CRYST GR, 196(1), 1999, pp. 53-61