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Citation: O. Jbara et al., Surface potential measurements of electron-irradiated insulators using backscattered and secondary electron spectra from an electrostatic toroidal spectrometer adapted for scanning electron microscope applications, REV SCI INS, 72(3), 2001, pp. 1788-1795

Authors: Belhaj, M Jbara, O Odof, S Msellak, K Rau, EI Andrianov, MV

Citation: M. Belhaj et al., An anomalous contrast in scanning electron microscopy of insulators: The pseudo-mirror effect, SCANNING, 22(6), 2000, pp. 352-356

Authors: Belhaj, M Odof, S Msellak, K Jbara, O

Citation: M. Belhaj et al., Time-dependent measurement of the trapped charge in electron irradiated insulators: Application to Al2O3-sapphire, J APPL PHYS, 88(5), 2000, pp. 2289-2294