Authors:
Cressler, JD
Hamilton, MC
Mullinax, GS
Li, Y
Niu, GF
Marshall, CJ
Marshall, PW
Kim, HS
Palmer, MJ
Joseph, AJ
Freeman, G
Citation: Jd. Cressler et al., The effects of proton irradiation on the lateral and vertical scaling of UHV/CVD SiGeHBT BiCMOS technology, IEEE NUCL S, 47(6), 2000, pp. 2515-2520