Authors: Cressler, JD Hamilton, MC Mullinax, GS Li, Y Niu, GF Marshall, CJ Marshall, PW Kim, HS Palmer, MJ Joseph, AJ Freeman, G

Citation: Jd. Cressler et al., The effects of proton irradiation on the lateral and vertical scaling of UHV/CVD SiGeHBT BiCMOS technology, IEEE NUCL S, 47(6), 2000, pp. 2515-2520