Authors:
Pettiette-Hall, CL
Murduck, J
Burch, JF
Sergant, H
Hu, R
Cordromp, J
Aquilino, H
Citation: Cl. Pettiette-hall et al., Electrical and materials characterization of a robust YBCO multilayer filmprocess for HTS circuit applications, IEEE APPL S, 9(2), 1999, pp. 1998-2001