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Results: 2

Authors: Murduck, J Pettiette-Hall, CL Hu, R Salazar, O McGerr, M Daly, K Luine, J
Citation: J. Murduck et al., HTS edge junction dependence on base electrode edge smoothness, IEEE APPL S, 9(2), 1999, pp. 3354-3357

Authors: Pettiette-Hall, CL Murduck, J Burch, JF Sergant, H Hu, R Cordromp, J Aquilino, H
Citation: Cl. Pettiette-hall et al., Electrical and materials characterization of a robust YBCO multilayer filmprocess for HTS circuit applications, IEEE APPL S, 9(2), 1999, pp. 1998-2001
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