Authors: SYNOWICKI RA HALE JS KUBIK RD NAFIS S WOOLLAM JA

Citation: Ra. Synowicki et al., MICROSTRUCTURAL CHARACTERIZATION OF SIOX SURFACE CONTAMINANTS ON ASHED ALUMINUM THIN-FILMS, Surface & coatings technology, 90(1-2), 1997, pp. 150-155

Authors: SYNOWICKI RA HALE JS SPADY B REISER M NAFIS S WOOLLAM JA

Citation: Ra. Synowicki et al., THIN-FILM MATERIALS EXPOSURE TO LOW-EARTH-ORBIT ABOARD SPACE-SHUTTLE, Journal of spacecraft and rockets, 32(1), 1995, pp. 97-102

Authors: NAFIS S IANNO NJ SYNDER PG MCGAHAN WA JOHS B WOOLLAM JA

Citation: S. Nafis et al., ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR STRUCTURES STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 253-255

Authors: SHAN ZS NAFIS S WOOLLAM J LIOU SH SELLMYER DJ

Citation: Zs. Shan et al., INTERFACE MAGNETISM AND SUPERPARAMAGNETISM OF CO CU MULTILAYERS/, Journal of applied physics, 73(10), 1993, pp. 6347-6349