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Results: 10

Authors: OTHONOS A NESTOROS M PALMERIO D CHRISTOFIDES C BES RS TRAVERSE JP
Citation: A. Othonos et al., PHOTOTHERMAL RADIOMETRY ON NICKEL (PIGMENTED ALUMINUM-OXIDE) SELECTIVE SOLAR ABSORBING SURFACE-COATINGS, Solar energy materials and solar cells, 51(2), 1998, pp. 171-179

Authors: KARMIOTIS Y NESTOROS M CHRISTOFIDES C
Citation: Y. Karmiotis et al., FINITE THICKNESS AND SEMIINFINITE PHOTOTHERMAL RADIOMETRIC MODELS FORTHE CHARACTERIZATION OF SEMICONDUCTORS, Applied physics letters, 72(6), 1998, pp. 695-697

Authors: MANDELIS A NESTOROS M OTHONOS A CHRISTOFIDES C
Citation: A. Mandelis et al., THERMOPHYSICAL CHARACTERIZATION OF COMMERCIAL PAPER BY LASER INFRAREDRADIOMETRY, Journal of pulp and paper science, 23(3), 1997, pp. 108-112

Authors: OTHONOS A MANDELIS A NESTOROS M CHRISTOFIDES C
Citation: A. Othonos et al., LASER PHOTOTHERMAL DIAGNOSTICS OF GENUINE AND COUNTERFEIT BRITISH ANDUNITED-STATES BANKNOTES, Optical engineering, 36(2), 1997, pp. 400-407

Authors: MANDELIS A NESTOROS M CHRISTOFIDES C
Citation: A. Mandelis et al., THERMOELECTRONIC-WAVE COUPLING IN LASER PHOTOTHERMAL THEORY OF SEMICONDUCTORS AT ELEVATED-TEMPERATURES, Optical engineering, 36(2), 1997, pp. 459-468

Authors: NESTOROS M GUTIERREZLLORENTE A OTHONOS A CHRISTOFIDES C MARTINEZDUART JM
Citation: M. Nestoros et al., PHOTOTHERMAL RADIOMETRIC AND SPECTROSCOPIC MEASUREMENTS ON SILICON-NITRIDE THIN-FILMS, Journal of applied physics, 82(12), 1997, pp. 6215-6219

Authors: NESTOROS M KARMIOTIS Y CHRISTOFIDES C
Citation: M. Nestoros et al., 2-LAYER MODEL FOR PHOTOTHERMAL RADIOMETRY APPLIED ON SEMICONDUCTING THIN-FILMS, Journal of applied physics, 82(12), 1997, pp. 6220-6227

Authors: NESTOROS M FORGET BC SEAS A CHRISTOFIDES C
Citation: M. Nestoros et al., PHOTOTHERMAL REFLECTION SIGNAL VERSUS TEMPERATURE - STUDY OF IMPLANTED SI WAFERS, Progress in Natural Science, 6, 1996, pp. 507-510

Authors: CHRISTOFIDES C DIAKONOS F SEAS A CHRISTOU C NESTOROS M MANDELIS A
Citation: C. Christofides et al., 2-LAYER MODEL FOR PHOTOMODULATED THERMOREFLECTANCE OF SEMICONDUCTOR WAFERS, Journal of applied physics, 80(3), 1996, pp. 1713-1725

Authors: NESTOROS M FORGET BC CHRISTOFIDES C SEAS A
Citation: M. Nestoros et al., PHOTOTHERMAL REFLECTION VERSUS TEMPERATURE - QUANTITATIVE-ANALYSIS, Physical review. B, Condensed matter, 51(20), 1995, pp. 14115-14123
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