Authors: NICOLAUS A BONSCH G

Citation: A. Nicolaus et G. Bonsch, DOUBLE-ENDED FIZEAU INTERFEROMETERS WITH PHASE-STEPPING EVALUATION FOR DIMENSIONAL MEASUREMENTS, TM. Technisches Messen, 65(3), 1998, pp. 83-90

Authors: BONSCH G NICOLAUS A BRAND U

Citation: G. Bonsch et al., WAVELENGTH MEASUREMENT OF A 544 NM FM-I-2-STABILIZED HE-NE-LASER, Optik, 107(3), 1998, pp. 127-131

Authors: BODERMANN B BONSCH G KNOCKEL H NICOLAUS A TIEMANN E

Citation: B. Bodermann et al., WAVELENGTH MEASUREMENTS OF 3 IODINE LINES BETWEEN 780 NM AND 795 NM, Metrologia, 35(2), 1998, pp. 105-113

Authors: BECKER P BETTIN H KOENDERS L MARTIN J NICOLAUS A ROTTGER S

Citation: P. Becker et al., THE SILICON PATH TO THE KILOGRAM, PTB-Mitteilungen, 106(5), 1996, pp. 321-329

Authors: GRIESER R BONSCH G DICKOPF S HUBER G KLEIN R MERZ P NICOLAUS A SCHNATZ H

Citation: R. Grieser et al., PRECISION-MEASUREMENT OF 2 IODINE LINES AT 585 NM AND 549 NM, ZEITSCHRIFT FUR PHYSIK A-HADRONS AND NUCLEI, 348(2), 1994, pp. 147-150