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IN-SITU ATOMIC-FORCE MICROSCOPY OBSERVATION OF CHANGE IN THICKNESS OFNICKEL-HYDROXIDE LAYER ON NI ELECTRODE
Authors: KOWAL A NIEWIARA R PERONCZYK B HABER J
Citation: A. Kowal et al., IN-SITU ATOMIC-FORCE MICROSCOPY OBSERVATION OF CHANGE IN THICKNESS OFNICKEL-HYDROXIDE LAYER ON NI ELECTRODE, Langmuir, 12(10), 1996, pp. 2332-2333
OBSERVATION OF NICKEL-HYDROXIDE LAYER ON NI ELECTRODE BY IN-SITU ATOMIC-FORCE MICROSCOPY
Authors: KOWAL A NIEWIARA R PERONCZYK B HABER J
Citation: A. Kowal et al., OBSERVATION OF NICKEL-HYDROXIDE LAYER ON NI ELECTRODE BY IN-SITU ATOMIC-FORCE MICROSCOPY, Acta Physica Polonica. A, 89(3), 1996, pp. 401-404
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