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Citation: Ecm. Noyons et Afj. Vanraan, ADVANCED MAPPING OF SCIENCE AND TECHNOLOGY, Scientometrics, 41(1-2), 1998, pp. 61-67

Authors: NOYONS ECM LUWEL M MOED HF

Citation: Ecm. Noyons et al., ASSESSMENT OF FLEMISH RESEARCH-AND-DEVELOPMENT IN THE FIELD OF INFORMATION TECHNOLOGY - A BIBLIOMETRIC EVALUATION BASED ON PUBLICATION AND PATENT DATA, COMBINED WITH OECD RESEARCH INPUT STATISTICS, Research policy, 27(3), 1998, pp. 285-300

Authors: NOYONS ECM VANRAAN AFJ

Citation: Ecm. Noyons et Afj. Vanraan, MONITORING SCIENTIFIC DEVELOPMENTS FROM A DYNAMIC PERSPECTIVE - SELF-ORGANIZED STRUCTURING TO MAP NEURAL-NETWORK RESEARCH, Journal of the American Society for Information Science, 49(1), 1998, pp. 68-81

Authors: NOYONS ECM VANRAAN AFJ

Citation: Ecm. Noyons et Afj. Vanraan, BIBLIOMETRIC CARTOGRAPHY OF SCIENTIFIC AND TECHNOLOGICAL DEVELOPMENTSOF AN RESEARCH-AND-DEVELOPMENT FIELD - THE CASE OF OPTOMECHATRONICS, Scientometrics, 30(1), 1994, pp. 157-173

Authors: NOYONS ECM VANRAAN AFJ GRUPP H SCHMOCH U

Citation: Ecm. Noyons et al., EXPLORING THE SCIENCE AND TECHNOLOGY INTERFACE - INVENTOR AUTHOR RELATIONS IN LASER MEDICINE RESEARCH, Research policy, 23(4), 1994, pp. 443-457