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Results: 1
IN-SITU STRAIN ANALYSIS WITH HIGH-SPATIAL-RESOLUTION - A NEW FAILURE INSPECTION TOOL FOR INTEGRATED-CIRCUIT APPLICATIONS
Authors:
NSHANINAN T DOVE R RAJAN K
Citation:
T. Nshaninan et al., IN-SITU STRAIN ANALYSIS WITH HIGH-SPATIAL-RESOLUTION - A NEW FAILURE INSPECTION TOOL FOR INTEGRATED-CIRCUIT APPLICATIONS, Engineering failure analysis, 3(2), 1996, pp. 109-113
Risultati:
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