AAAAAA

   
Results: 1-11 |
Results: 11
HIGH-PRECISION MEASUREMENT OF TEMPERATURE FACTORS FOR NIAL BY CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: NUCHTER W WEICKENMEIER AL MAYER J
Citation: W. Nuchter et al., HIGH-PRECISION MEASUREMENT OF TEMPERATURE FACTORS FOR NIAL BY CONVERGENT-BEAM ELECTRON-DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 54, 1998, pp. 147-157
THERMAL SPRAYING OF NANOCRYSTALLINE NI COATINGS
Authors: LAU ML JIANG HG NUCHTER W LAVERNIA EJ
Citation: Ml. Lau et al., THERMAL SPRAYING OF NANOCRYSTALLINE NI COATINGS, Physica status solidi. a, Applied research, 166(1), 1998, pp. 257-268
DETERMINATION OF BONDING CHARGE-DENSITY IN NIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: NUCHTER W WEICKENMEIER AL MAYER J
Citation: W. Nuchter et al., DETERMINATION OF BONDING CHARGE-DENSITY IN NIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Physica status solidi. a, Applied research, 166(1), 1998, pp. 367-379
IMAGING DETECTORS IN QUANTITATIVE TRANSMI SSION ELECTRON-MICROSCOPY
Authors: WEICKENMEIER AL NUCHTER W GEMMING T NUFER S MAYER J
Citation: Al. Weickenmeier et al., IMAGING DETECTORS IN QUANTITATIVE TRANSMI SSION ELECTRON-MICROSCOPY, European journal of cell biology, 74, 1997, pp. 4-4
QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIF FRACTION IN THE INTERMETALLIC COMPOUND NIAL
Authors: NUCHTER W WEICKENMEIER AL MAYER J
Citation: W. Nuchter et al., QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIF FRACTION IN THE INTERMETALLIC COMPOUND NIAL, European journal of cell biology, 74, 1997, pp. 46-46
EXPERIMENTAL-DETERMINATION OF LATTICE SHE AR WITH CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: KRAMER S NUCHTER W WEICKENMEIER A MAYER J
Citation: S. Kramer et al., EXPERIMENTAL-DETERMINATION OF LATTICE SHE AR WITH CONVERGENT-BEAM ELECTRON-DIFFRACTION, European journal of cell biology, 74, 1997, pp. 48-48
DETECTOR SYSTEMS IN QUANTITATIVE HIGH-RES OLUTION ELECTRON-MICROSCOPY
Authors: NUCHTER W WEICKENMEIER AL GEMMING T MAYER J
Citation: W. Nuchter et al., DETECTOR SYSTEMS IN QUANTITATIVE HIGH-RES OLUTION ELECTRON-MICROSCOPY, European journal of cell biology, 74, 1997, pp. 132-132
LOW-ORDER STRUCTURE-FACTOR AMPLITUDE AND SIGN DETERMINATION OF AN UNKNOWN STRUCTURE ALMFE BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: CHENG YF NUCHTER W MAYER J WEICKENMEIER A GJONNES J
Citation: Yf. Cheng et al., LOW-ORDER STRUCTURE-FACTOR AMPLITUDE AND SIGN DETERMINATION OF AN UNKNOWN STRUCTURE ALMFE BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 52, 1996, pp. 923-936
ELECTRON CHANNELING - A METHOD IN REAL-SPACE CRYSTALLOGRAPHY AND A COMPARISON WITH THE ATOMIC LOCATION BY CHANNELING-ENHANCED MICROANALYSIS
Authors: NUCHTER W SIGLE W
Citation: W. Nuchter et W. Sigle, ELECTRON CHANNELING - A METHOD IN REAL-SPACE CRYSTALLOGRAPHY AND A COMPARISON WITH THE ATOMIC LOCATION BY CHANNELING-ENHANCED MICROANALYSIS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 71(1), 1995, pp. 165-186
QUANTITATIVE CHARACTERIZATION OF POINT-SPREAD FUNCTION AND DETECTION QUANTUM EFFICIENCY FOR A YAG SCINTILLATOR SLOW-SCAN CCD CAMERA
Authors: WEICKENMEIER AL NUCHTER W MAYER J
Citation: Al. Weickenmeier et al., QUANTITATIVE CHARACTERIZATION OF POINT-SPREAD FUNCTION AND DETECTION QUANTUM EFFICIENCY FOR A YAG SCINTILLATOR SLOW-SCAN CCD CAMERA, Optik, 99(4), 1995, pp. 147-154
THE STRUCTURE OF DECAGONAL AL-CU-CO-SI - AN ELECTRON CHANNELING STUDY
Authors: NUCHTER W SIGLE W
Citation: W. Nuchter et W. Sigle, THE STRUCTURE OF DECAGONAL AL-CU-CO-SI - AN ELECTRON CHANNELING STUDY, Philosophical magazine letters, 70(3), 1994, pp. 103-109
Risultati: 1-11 |