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Citation: Ae. Naciri et al., Surface effects of the Hgl(2) crystal characterized by spectroscopic ellipsometry, APPL OPTICS, 40(25), 2001, pp. 4519-4525

Authors: Naciri, AE Johann, L Kleim, R Sieskind, M Amann, M

Citation: Ae. Naciri et al., Determination of complex optical constants of uniaxial HgI2 by spectroscopic conventional and generalized ellipsometry, PHYS ST S-A, 175(1), 1999, pp. 413-419

Authors: Naciri, AE Johann, L Kleim, R Sieskind, M Amann, M

Citation: Ae. Naciri et al., Spectroscopic ellipsometry of anisotropic materials: Application to the optical constants of HgI2, APPL OPTICS, 38(4), 1999, pp. 647-654

Authors: Naciri, AE Johann, L Kleim, R

Citation: Ae. Naciri et al., Spectroscopic generalized ellipsometry based Fourier analysis, APPL OPTICS, 38(22), 1999, pp. 4802-4811