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Results:
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Results: 2
Relation between electroluminescence and degradation in XLPE
Authors:
Fan, ZH Takahashi, T Suzuki, J Miyata, H Iemura, S Itoh, T Nakiri, T Shimizu, N
Citation:
Zh. Fan et al., Relation between electroluminescence and degradation in XLPE, IEEE DIELEC, 8(1), 2001, pp. 91-96
Long-term reliability testing of 500 kV DC PPLP-insulated oil-filled cableand accessories
Authors:
Nakiri, T Maekawa, Y Takashima, H Imajo, T Hirota, H Ishii, K Nakao, Y Shimoda, M
Citation:
T. Nakiri et al., Long-term reliability testing of 500 kV DC PPLP-insulated oil-filled cableand accessories, IEEE POW D, 14(2), 1999, pp. 319-326
Risultati:
1-2
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