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Authors: Neale, R Ameen, J
Citation: R. Neale et J. Ameen, Earthmoving productivity estimation using linear regression techniques - Discussion, J CONS ENG, 127(1), 2001, pp. 88-88

Authors: Farhat, IA Protzmann, J Becker, A Valles-Pamies, B Neale, R Hill, SE
Citation: Ia. Farhat et al., Effect of the extent of conversion and retrogradation on the digestibilityof potato starch, STARCH, 53(9), 2001, pp. 431-436

Authors: Neale, R
Citation: R. Neale, Non-volatile and Flash memory developments, ELECTRO ENG, 73(898), 2001, pp. 11

Authors: Neale, R
Citation: R. Neale, Chomerics new EMI gaskets target low-cost shielding, ELECTRO ENG, 73(898), 2001, pp. 39-39

Authors: Neale, R
Citation: R. Neale, Matsushita's eco-friendly tilt switches, ELECTRO ENG, 73(898), 2001, pp. 55-55

Authors: Neale, R
Citation: R. Neale, The source of silicon to come, ELECTRO ENG, 73(897), 2001, pp. 7-7

Authors: Neale, R
Citation: R. Neale, New STM motor & coil driver for 5 and 12V apps, ELECTRO ENG, 73(897), 2001, pp. 13-14

Authors: Neale, R
Citation: R. Neale, Thirty two channel voltage amplifier, ELECTRO ENG, 73(897), 2001, pp. 16-16

Authors: Neale, R
Citation: R. Neale, COTS and performance based specifications - the blind leading the blind?, ELECTRO ENG, 73(897), 2001, pp. 18

Authors: Neale, R
Citation: R. Neale, The motor becomes the package; mechanical and silicon optimization, ELECTRO ENG, 73(897), 2001, pp. 33

Authors: Neale, R
Citation: R. Neale, Atmel's microFPSLIC matches the chip to the needs, ELECTRO ENG, 73(897), 2001, pp. 57-58

Authors: Neale, R
Citation: R. Neale, Facing the alligators, ELECTRO ENG, 73(896), 2001, pp. 7-7

Authors: Neale, R
Citation: R. Neale, Optimizing the mechanical & electronic mix for keyboards, ELECTRO ENG, 73(896), 2001, pp. 25

Authors: Neale, R
Citation: R. Neale, What is this? the explanation, ELECTRO ENG, 73(896), 2001, pp. 35-36

Authors: Neale, R
Citation: R. Neale, Changes, subtle and significant, ELECTRO ENG, 73(895), 2001, pp. 7-7

Authors: Neale, R
Citation: R. Neale, Stencil cleaning for dirty footprints, ELECTRO ENG, 73(895), 2001, pp. 43-43

Authors: Neale, R
Citation: R. Neale, AXIS Systems will allow software debug to get ahead of the hardware, ELECTRO ENG, 73(894), 2001, pp. 11-11

Authors: Neale, R
Citation: R. Neale, TransEDA debuts new verification solutions at DAC 2001, ELECTRO ENG, 73(894), 2001, pp. 12-12

Authors: Neale, R
Citation: R. Neale, STM and Xicor - the ins-and-outs of the serial non-volatile business, ELECTRO ENG, 73(894), 2001, pp. 57-58

Authors: Neale, R
Citation: R. Neale, What is it? the reader's view, ELECTRO ENG, 73(894), 2001, pp. 67-68

Authors: Neale, R
Citation: R. Neale, Towards a world of EMC design perfection - but not there yet, ELECTRO ENG, 73(893), 2001, pp. 69-69

Authors: Neale, R
Citation: R. Neale, Measuring electromagnetic fields with portable instrumentation, ELECTRO ENG, 73(893), 2001, pp. 77-77

Authors: Neale, R
Citation: R. Neale, New study of radiation risk to high fliers, ELECTRO ENG, 73(893), 2001, pp. 79

Authors: Neale, R
Citation: R. Neale, Meeting the electromagnetic compatibility requirements of space, ELECTRO ENG, 73(893), 2001, pp. 83-83

Authors: Neale, R
Citation: R. Neale, What do we do for an encore?, ELECTRO ENG, 73(892), 2001, pp. 7-7
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