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Results:
1-8
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Results: 8
Authors:
Negishi, R
Yoshizawa, M
Zhou, SM
Matsumoto, I
Fukamachi, T
Kawamura, T
Citation: R. Negishi et al., Image contrast of lattice defects in X-ray topography by resonant scattering, JPN J A P 2, 40(8B), 2001, pp. L884-L887
Authors:
Negishi, R
Shigeta, Y
Citation: R. Negishi et Y. Shigeta, Surface roughening induced by a characteristic surface structure of a Si film grown on Si(111), SURF SCI, 481(1-3), 2001, pp. 67-77
Authors:
Kawai, M
Masuko, Y
Kawase, Y
Negishi, R
Citation: M. Kawai et al., Micromechanical analysis of the off axis rate-dependent inelastic behaviorof unidirectional AS4/PEEK at high temperature, INT J MECH, 43(9), 2001, pp. 2069-2090
Authors:
Fujii, T
Tajima, T
Negishi, R
Okitsu, I
Tomizawa, Y
Matsuda, I
Hamada, E
Citation: T. Fujii et al., Approach for high speed recording of 4.7 GB digital versatile disc-recordable, JPN J A P 1, 39(2B), 2000, pp. 779-784
Authors:
Hamada, E
Takagishi, Y
Yoshizawa, T
Fujii, T
Negishi, R
Nakajima, T
Citation: E. Hamada et al., Ten-year overview and future prospects of write-once organic recordable media, JPN J A P 1, 39(2B), 2000, pp. 785-788
Authors:
Xu, ZC
Guo, CL
Zhao, ZY
Fukamachi, T
Negishi, R
Yoshizawa, M
Sakamaki, T
Nakajima, T
Citation: Zc. Xu et al., The fluorescence emission from GaAs in the Laue case near the absorption edge, J ALLOY COM, 286(1-2), 1999, pp. 265-270
Authors:
Negishi, R
Fukamachi, T
Kawamura, T
Citation: R. Negishi et al., X-ray standing wave as a result of only the imaginary part of the atomic scattering factor, ACT CRYST A, 55(2), 1999, pp. 267-273
Authors:
Qi, ZM
Negishi, R
Fukamachi, T
Zhao, ZY
Kawamura, T
Citation: Zm. Qi et al., Origin of enhanced Borrmann effect in asymmetric lane case, J PHYS JPN, 68(11), 1999, pp. 3528-3532
Risultati:
1-8
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