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Results: 1
Spatial characterization of process variations via MOS transistor time constants in VLSI and WSI
Authors:
Nekili, M Savaria, Y Bois, G
Citation:
M. Nekili et al., Spatial characterization of process variations via MOS transistor time constants in VLSI and WSI, IEEE J SOLI, 34(1), 1999, pp. 80-84
Risultati:
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