Authors: Kenny, MJ Leistner, AJ Walsh, CJ Fen, K Giardini, WJ Wielunski, LS Netterfield, RP Ward, BR

Citation: Mj. Kenny et al., Precision determination of the density of a single crystal silicon sphere and evaluation of the avogadro constant, IEEE INSTR, 50(2), 2001, pp. 587-592

Authors: Martin, PJ Bendavid, A Netterfield, RP Kinder, TJ Jahan, F Smith, G

Citation: Pj. Martin et al., Plasma deposition of tribological and optical thin film materials with a filtered cathodic arc source, SURF COAT, 112(1-3), 1999, pp. 257-260

Authors: Kenny, MJ Netterfield, RP Wielunski, LS Beaglehole, D

Citation: Mj. Kenny et al., Surface layer impurities on silicon spheres used in determination of the Avogadro constant, IEEE INSTR, 48(2), 1999, pp. 233-237