Authors:
Neves, BRA
Salmon, ME
Russell, PE
Troughton, EB
Citation: Bra. Neves et al., Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate, MICROS MICR, 5(6), 1999, pp. 413-419
Authors:
Neves, BRA
Leonard, DN
Salmon, ME
Russell, PE
Troughton, EB
Citation: Bra. Neves et al., Observation of topography inversion in atomic force microscopy of self-assembled monolayers, NANOTECHNOL, 10(4), 1999, pp. 399-404
Authors:
Neves, BRA
Vilela, JMC
Russell, PE
Reis, ACC
Andrade, MS
Citation: Bra. Neves et al., Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies, ULTRAMICROS, 76(1-2), 1999, pp. 61-67
Citation: Bra. Neves et Ms. Andrade, Identification of two patterns in magnetic force microscopy of shape memory alloys, APPL PHYS L, 74(14), 1999, pp. 2090-2092