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Results: 1-25/37
Authors:
Ngoi, BKA
Venkatakrishnan, K
Tan, B
Stanley, P
Lim, LEN
Citation: Bka. Ngoi et al., Angular dispersion compensation for acoustooptic devices used for ultrashort-pulsed laser micromachining, OPT EXPRESS, 9(4), 2001, pp. 200-206
Authors:
Ngoi, BKA
Venkatakrishnan, K
Tan, B
Sivakumar, NR
Citation: Bka. Ngoi et al., The effect of Rowland Ghost on sub-micron-machining using femtosecond pulsed laser, OPT EXPRESS, 8(9), 2001, pp. 492-496
Authors:
Ngoi, BKA
Venkatakrishnan, K
Lim, LEN
Tan, B
Citation: Bka. Ngoi et al., Submicron micromachining on silicon wafer using femtosecond pulse laser, J LASER APP, 13(1), 2001, pp. 41-43
Authors:
Zhou, M
Ngoi, BKA
Citation: M. Zhou et Bka. Ngoi, Effect of tool and workpiece anisotropy on microcutting processes, P I MEC E B, 215(1), 2001, pp. 13-19
Authors:
Sreejith, PS
Ngoi, BKA
Citation: Ps. Sreejith et Bka. Ngoi, Material removal mechanisms in precision machining of new materials, INT J MACH, 41(12), 2001, pp. 1831-1843
Authors:
Sreejith, PS
Ngoi, BKA
Citation: Ps. Sreejith et Bka. Ngoi, New materials and their machining, INT J ADV M, 18(8), 2001, pp. 537-544
Authors:
Sreejith, PS
Udupa, G
Noor, YBM
Ngoi, BKA
Citation: Ps. Sreejith et al., Recent advances in machining of silicon wafers for semiconductor applications, INT J ADV M, 17(3), 2001, pp. 157-162
Authors:
Udupa, G
Ngoi, BKA
Citation: G. Udupa et Bka. Ngoi, Form error characterisation by an optical profiler, INT J ADV M, 17(2), 2001, pp. 114-124
Authors:
Ngoi, BKA
Venkatakrishnan, K
Lim, ENL
Tan, B
Koh, LHK
Citation: Bka. Ngoi et al., Effect of energy above laser-induced damage thresholds in the micromachining of silicon by femtosecond pulse laser, OPT LASER E, 35(6), 2001, pp. 361-369
Authors:
Ngoi, BKA
Venkatakrishnan, K
Citation: Bka. Ngoi et K. Venkatakrishnan, Self-compensation heterodyne vibrometer using an acousto-optic modulator as vibration detector, OPT ENG, 40(8), 2001, pp. 1563-1567
Authors:
Fu, YQ
Ngoi, BKA
Citation: Yq. Fu et Bka. Ngoi, Investigation of diffractive-refractive microlens array fabricated by focused ion beam technology, OPT ENG, 40(4), 2001, pp. 511-516
Authors:
Lu, YG
Zhong, ZW
Yu, J
Xie, HM
Ngoi, BKA
Chai, GB
Asundi, A
Citation: Yg. Lu et al., Thermal deformation measurement of electronic packages using the atomic force microscope scanning moire technique, REV SCI INS, 72(4), 2001, pp. 2180-2185
Authors:
Ngoi, BKA
Venkatakrishnan, K
Sivakumar, N
Bo, T
Citation: Bka. Ngoi et al., Instantaneous phase shifting arrangement for microsurface profiling of flat surfaces, OPT COMMUN, 190(1-6), 2001, pp. 109-116
Authors:
Ngoi, BKA
Venkatakrishnan, K
Sivakumar, NR
Citation: Bka. Ngoi et al., Phase-shifting interferometry immune to vibration, APPL OPTICS, 40(19), 2001, pp. 3211-3214
Authors:
Ngoi, BKA
Venkatakrishnan, K
Teng, JL
Lim, LSK
Citation: Bka. Ngoi et al., Methods of improving resolution on a heterodyne acousto-optic vibrometer, J LASER APP, 12(5), 2000, pp. 215-220
Authors:
Xie, HM
Kishimoto, S
Asundi, A
Boay, CG
Shinya, N
Yu, J
Ngoi, BKA
Citation: Hm. Xie et al., In-plane deformation measurement using the atomic force microscope moire method, NANOTECHNOL, 11(1), 2000, pp. 24-29
Authors:
Ngoi, BKA
Lim, BH
Ong, AS
Citation: Bka. Ngoi et al., The Nexus method for evaluating geometric dimensioning and tolerancing problems with position callout, P I MEC E B, 214(3), 2000, pp. 235-241
Authors:
Sreejith, PS
Ngoi, BKA
Citation: Ps. Sreejith et Bka. Ngoi, Dry machining: Machining of the future, J MATER PR, 101(1-3), 2000, pp. 287-291
Authors:
Ngoi, BKA
Sreejith, PS
Citation: Bka. Ngoi et Ps. Sreejith, Ductile regime finish machining - A review, INT J ADV M, 16(8), 2000, pp. 547-550
Authors:
Ngoi, BKA
Chin, CS
Citation: Bka. Ngoi et Cs. Chin, Self-compensated heterodyne laser interferometer, INT J ADV M, 16(3), 2000, pp. 217-219
Authors:
Ngoi, BKA
Venkatakrishnan, K
Citation: Bka. Ngoi et K. Venkatakrishnan, An acousto-optic vibrometer for measurement of vibration in ultra-precision machine tools, INT J ADV M, 16(11), 2000, pp. 830-834
Authors:
Ngoi, BKA
Venkatakrishnan, K
Citation: Bka. Ngoi et K. Venkatakrishnan, Noncontact homodyne scanning laser vibrometer for dynamic measurement, OPT ENG, 39(2), 2000, pp. 510-515
Authors:
Ngoi, BKA
Venkatakrishnan, K
Citation: Bka. Ngoi et K. Venkatakrishnan, Scanning laser vibrometer for dynamic study of small features, OPT ENG, 39(11), 2000, pp. 2995-3000
Authors:
Fu, YQ
Ngoi, BKA
Citation: Yq. Fu et Bka. Ngoi, Investigation of direct milling of micro-optical elements with continuous relief on a substrate by focused ion beam technology, OPT ENG, 39(11), 2000, pp. 3008-3013
Authors:
Ngoi, BKA
Venkatakrishnan, K
Tan, B
Noel, N
Shen, ZW
Chin, CS
Citation: Bka. Ngoi et al., Two-axis-scanning laser Doppler vibrometer for microstructure, OPT COMMUN, 182(1-3), 2000, pp. 175-185