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In situ monitoring of optical coatings on architectural glass and comparison of the accuracy of the layer thickness attainable with ellipsometry and photometry
Authors: Vergohl, M Malkomes, N Matthee, T Brauer, G Richter, U Nickol, FW Bruch, J
Citation: M. Vergohl et al., In situ monitoring of optical coatings on architectural glass and comparison of the accuracy of the layer thickness attainable with ellipsometry and photometry, THIN SOL FI, 392(2), 2001, pp. 258-264
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