Authors: Niemczyk, TM Zhang, SB Haaland, DM

Citation: Tm. Niemczyk et al., Monitoring dielectric thin-film production on product wafers using infrared emission spectroscopy, APPL SPECTR, 55(8), 2001, pp. 1053-1059

Authors: Niemczyk, TM Zhang, SB Franke, JE Haaland, DM

Citation: Tm. Niemczyk et al., Quantitative determination of borophosphosilicate glass thin-film properties using infrared emission spectroscopy, APPL SPECTR, 53(7), 1999, pp. 822-828

Authors: Han, L Niemczyk, TM Haaland, DM Lopez, GP

Citation: L. Han et al., Enhancing IR detection limits for trace polar organics in aqueous solutions with surface-modified sol-gel-coated ATR sensors, APPL SPECTR, 53(4), 1999, pp. 381-389

Authors: Haaland, DM Han, L Niemczyk, TM

Citation: Dm. Haaland et al., Use of CLS to understand PLS IR calibration for trace detection of organicmolecules in water, APPL SPECTR, 53(4), 1999, pp. 390-395

Authors: Alam, MK Rohrscheib, MR Franke, JE Niemczyk, TM Maynard, JD Robinson, MR

Citation: Mk. Alam et al., Measurement of pH in whole blood by near-infrared spectroscopy, APPL SPECTR, 53(3), 1999, pp. 316-324