Authors:
Richter, T
Kuhnel, G
Siegel, W
Niklas, JR
Citation: T. Richter et al., Activation energies of the EL6 trap and of the 0.15 eV donor and their correlation in GaAs, SEMIC SCI T, 15(11), 2000, pp. 1039-1044
Authors:
Habermann, D
Gotte, T
Meijer, J
Stephan, A
Richter, DK
Niklas, JR
Citation: D. Habermann et al., High resolution rare-earth elements analyses of natural apatite and its application in geo-sciences: Combined micro-PIXE, quantitative CL spectroscopy and electron spin resonance analyses, NUCL INST B, 161, 2000, pp. 846-851
Authors:
Herms, M
Fukuzawa, M
Yamada, M
Klober, J
Zychowitz, G
Niklas, JR
Citation: M. Herms et al., Photoelastic characterization of residual strain in GaAs wafers annealed in holders of different geometry, MAT SCI E B, 66(1-3), 1999, pp. 7-10