Authors: Nkansah, FD Hatalis, M

Citation: Fd. Nkansah et M. Hatalis, Effects of flash EEPROM floating gate morphology on electrical behavior offast programming bits, IEEE DEVICE, 46(7), 1999, pp. 1355-1362

Authors: Nkansah, FD Prinz, E Hatalis, M

Citation: Fd. Nkansah et al., Nonerratic behavior of overerased bits in flash EEPROM, J VAC SCI B, 16(6), 1998, pp. 3065-3068