Authors:
Corni, F
Nobili, C
Tonini, R
Ottaviani, G
Tonelli, M
Citation: F. Corni et al., Helium/deuterium coimplanted silicon: A thermal desorption spectrometry investigation, APPL PHYS L, 78(19), 2001, pp. 2870-2872
Authors:
Corni, F
Calzolari, G
Gambetta, F
Nobili, C
Tonini, R
Zapparoli, M
Citation: F. Corni et al., Evolution of vacancy-like defects in helium-implanted (100) silicon studied by thermal desorption spectrometry, MAT SCI E B, 71, 2000, pp. 207-212
Authors:
Brusa, RS
Karwasz, GP
Tiengo, N
Zecca, A
Corni, F
Calzolari, G
Nobili, C
Citation: Rs. Brusa et al., He-implantation induced defects in Si studied by slow positron annihilation spectroscopy, J APPL PHYS, 85(4), 1999, pp. 2390-2397
Authors:
Corni, F
Calzolari, G
Frabboni, S
Nobili, C
Ottaviani, G
Tonini, R
Cerofolini, GF
Leone, D
Servidori, M
Brusa, RS
Karwasz, GP
Tiengo, N
Zecca, A
Citation: F. Corni et al., Helium-implanted silicon: A study of bubble precursors, J APPL PHYS, 85(3), 1999, pp. 1401-1408