AAAAAA

   
Results: 1-5 |
Results: 5

Authors: Stevenson, CM Abdelrehim, IM Novak, SW
Citation: Cm. Stevenson et al., Infra-red photoacoustic and secondary ion mass spectrometry measurements of obsidian hydration rims, J ARCH SCI, 28(1), 2001, pp. 109-115

Authors: Novak, SW Bekos, EJ Marino, JW
Citation: Sw. Novak et al., Approaching the limit for quantitative SIMS measurement of ultra-thin nitrided SiO2 films, APPL SURF S, 175, 2001, pp. 678-684

Authors: Cole, DA Shallenberger, JR Novak, SW Moore, RL Edgell, MJ Smith, SP Hitzman, CJ Kirchhoff, JF Principe, E Nieveen, W Huang, FK Biswas, S Bleiler, RJ Jones, K
Citation: Da. Cole et al., SiO2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry, J VAC SCI B, 18(1), 2000, pp. 440-444

Authors: Pinto, JR Novak, SW Nicholas, M
Citation: Jr. Pinto et al., Aqueous dye diffusion in thin films of water-soluble poly(vinyl pyrrolidone) copolymers: A dynamic secondary ion mass spectrometry study, J PHYS CH B, 103(37), 1999, pp. 8026-8032

Authors: Shallenberger, JR Cole, DA Novak, SW
Citation: Jr. Shallenberger et al., Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy, J VAC SCI A, 17(4), 1999, pp. 1086-1090
Risultati: 1-5 |