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Results: 3

Authors: OGUSHI S SADAMITSU S MARSDEN K KOIKE Y SANO M
Citation: S. Ogushi et al., GETTERING CHARACTERISTICS OF HEAVY-METAL IMPURITIES IN SILICON-WAFERSWITH POLYSILICON BACK SEAL AND INTERNAL GETTERING, JPN J A P 1, 36(11), 1997, pp. 6601-6606

Authors: MIYAZAKI M MIYAZAKI S OGUSHI S OCHIAI T SANO M SHIGEMATSU T
Citation: M. Miyazaki et al., EFFICIENCY OF BORON GETTERING FOR IRON IMPURITIES IN P P(+) EPITAXIALSILICON-WAFERS/, JPN J A P 2, 36(4A), 1997, pp. 380-381

Authors: OGUSHI S TERASAWA M TEZUKA H
Citation: S. Ogushi et al., RHO-OMEGA OSCILLATION AND CHARGE-SYMMETRY BREAKING, Physical review. C. Nuclear physics, 56(5), 1997, pp. 2382-2386
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