Authors:
TAKATANI S
MATSUMOTO H
SHIGETA J
OHSHIKA K
YAMASHITA T
FUKUI M
Citation: S. Takatani et al., GENERATION MECHANISM OF GATE LEAKAGE CURRENT DUE TO REVERSE-VOLTAGE STRESS IN I-ALGAAS N-GAAS HIGFETS/, I.E.E.E. transactions on electron devices, 45(1), 1998, pp. 14-20
Authors:
OHSHIKA K
YANAZAWA H
KURODA J
KAYAMA S
SASAKI Y
Citation: K. Ohshika et al., OPTIMIZATION OF SION FILM COMPOSITIONS FOR ENCAPSULATION OF REFRACTORY-METAL GATE GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR, Journal of the Electrochemical Society, 145(1), 1998, pp. 323-328
Citation: K. Ohshika, GEOMETRICALLY FINITE KLEINIAN-GROUPS AND PARABOLIC ELEMENTS, Proceedings of the Edinburgh Mathematical Society, 41, 1998, pp. 141-159
Citation: K. Ohshika et L. Potyagailo, SELF-EMBEDDINGS OF KLEINIAN-GROUPS, Annales Scientifiques de l'Ecole Normale Superieure, 31(3), 1998, pp. 329-343
Citation: K. Ohshika, RIGIDITY AND TOPOLOGICAL CONJUGATES OF TOPOLOGICALLY TAME KLEINIAN-GROUPS, Transactions of the American Mathematical Society, 350(10), 1998, pp. 3989-4022
Citation: K. Ohshika et H. Ikeda, ISOLATION AND PRESERVATION OF THE LIVING EMBRYO SAC OF CRINUM-ASIATICUM L VAR JAPONICUM BAKER, Journal of plant research, 107(1085), 1994, pp. 17-21