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Authors: IKEDA S OKIHARA M UCHIDA H HIRASHITA N
Citation: S. Ikeda et al., CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPE STUDIES ON INTRINSICBREAKDOWN SPOTS OF THIN GATE OXIDES, JPN J A P 1, 36(5A), 1997, pp. 2561-2564

Authors: OKIHARA M KURODA S ITOH M HIRASHITA N
Citation: M. Okihara et al., EFFECT OF STRESS ON OXIDE EDGE SHAPE OF LOCAL OXIDATION OF SILICON FOR VARIOUS OXIDATION TEMPERATURES, JPN J A P 1, 34(4A), 1995, pp. 1822-1826

Authors: OKIHARA M HIRASHITA N HASHIMOTO K ONODA H
Citation: M. Okihara et al., TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION OF INTERFACIAL REACTIONSIN HIGH-TEMPERATURE SPUTTERED AL ALLOY TIN SYSTEM/, Applied physics letters, 66(11), 1995, pp. 1328-1330
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