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Results: 26-43/43
Authors:
OKUMA S
SAEKI K
KOBAYASHI A
OSHITA E
WAKITA K
YASUMOTO M
OGINO S
NISHIMURA E
TOMIMASU T
Citation: S. Okuma et al., FEL BEAM SHARING SYSTEMS FOR 8 USERS-STATIONS AT THE FELI, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 375(1-3), 1996, pp. 654-656
Authors:
SASAKI M
HANE K
OKUMA S
TORII A
Citation: M. Sasaki et al., SCANNING FORCE MICROSCOPE TECHNIQUE FOR ADHESION DISTRIBUTION MEASUREMENT, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 350-354
Authors:
SASAKI M
OKUMA S
MIYATA K
HANE K
TAKEDA Y
Citation: M. Sasaki et al., ULTRASONIC ATOMIZATION OF THE DNA SOLUTION FOR ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 355-360
Authors:
ABE T
HANE K
OKUMA S
Citation: T. Abe et al., CHARACTERISTICS OF DC-VOLTAGE SURFACE MODIFICATION OF GRAPHITE USING SCANNING TUNNELING MICROSCOPE, International journal of the Japan Society for Precision Engineering, 29(2), 1995, pp. 123-127
Authors:
SUZUKI T
YASUE M
OKUMA S
UCHIKAWA Y
Citation: T. Suzuki et al., DISCRETE-TIME LEARNING CONTROL FOR ROBOTIC MANIPULATORS, Advanced robotics, 9(1), 1995, pp. 1-14
Authors:
OKUMA S
KOKUBO N
Citation: S. Okuma et N. Kokubo, UNUSUAL INSULATING PHASE AT LOW-TEMPERATURE IN THIN INDIUM FILMS, Physical review. B, Condensed matter, 51(21), 1995, pp. 15415-15419
Authors:
OKUMA S
KOKUBO N
Citation: S. Okuma et N. Kokubo, FIELD-INDUCED SUPERCONDUCTOR-INSULATOR TRANSITION AND GRAIN-SIZE IN THIN GRANULAR FILMS OF INDIUM, Solid state communications, 93(12), 1995, pp. 1019-1023
Authors:
GOTO K
SASAKI M
OKUMA S
HANE K
Citation: K. Goto et al., A DOUBLE-FOCUS LENS INTERFEROMETER FOR SCANNING FORCE MICROSCOPY, Review of scientific instruments, 66(5), 1995, pp. 3182-3185
Authors:
OKUMA S
ENYA K
HIRAI H
Citation: S. Okuma et al., DIMENSIONALITY CROSSOVER OF THE NONLINEAR RESISTANCE IN QUENCH-CONDENSED INDIUM FILMS, Journal of the Physical Society of Japan, 64(9), 1995, pp. 3397-3402
Authors:
TORII A
SASAKI M
HANE K
OKUMA S
Citation: A. Torii et al., ADHESIVE FORCE DISTRIBUTION ON MICROSTRUCTURES INVESTIGATED BY AN ATOMIC-FORCE MICROSCOPE, Sensors and actuators. A, Physical, 44(2), 1994, pp. 153-158
Authors:
TORII A
SASAKI M
HANE K
OKUMA S
Citation: A. Torii et al., ADHESION OF MICROSTRUCTURES INVESTIGATED BY ATOMIC-FORCE MICROSCOPY, Sensors and actuators. A, Physical, 40(1), 1994, pp. 71-76
Authors:
OKUMA S
Citation: S. Okuma, SUPPRESSION OF SUPERCONDUCTIVITY BY MAGNETIC-FIELD IN QUENCH-CONDENSED ULTRATHIN FILMS OF INDIUM, Materials science & engineering. B, Solid-state materials for advanced technology, 25(2-3), 1994, pp. 187-191
Authors:
AKIMITSU J
AMANO J
YOSHINARI M
KOKUBIN M
IWASAKI T
OKUMA S
NISHIDA N
NISHIYAMA K
MORI N
Citation: J. Akimitsu et al., MAGNETIC PHASE-TRANSITIONS IN (PR2-XCEX)CUO4-DELTA, Hyperfine interactions, 85(1-4), 1994, pp. 187-192
Authors:
SASAKI M
HANE K
OKUMA S
BESSHO Y
Citation: M. Sasaki et al., SHAPE OF THE CANTILEVER DEFLECTION FOR THE ATOMIC-FORCE MICROSCOPE INFORCE CURVE MEASUREMENTS, Review of scientific instruments, 65(6), 1994, pp. 1930-1934
Authors:
SASAKI M
HANE K
OKUMA S
HINO M
BESSHO Y
Citation: M. Sasaki et al., IMPROVED DIFFERENTIAL HETERODYNE INTERFEROMETER FOR ATOMIC-FORCE MICROSCOPY, Review of scientific instruments, 65(12), 1994, pp. 3697-3701
Authors:
OKUMA S
MAKINO M
NAKATSUKA T
Citation: S. Okuma et al., MAGNETIZATION INTENSITY MAPPING IN AND AROUND IZU-OSHIMA VOLCANO, JAPAN, Journal of Geomagnetism and Geoelectricity, 46(6), 1994, pp. 541-556
Authors:
ABE T
HANE K
OKUMA S
Citation: T. Abe et al., NANOMETER-SCALE PIT FORMATION BY SCANNING-TUNNELING-MICROSCOPY ON GRAPHITE SURFACE AND TIP CURRENT MEASUREMENTS, Journal of applied physics, 75(2), 1994, pp. 1228-1230
Authors:
TORII A
SASAKI M
HANE K
OKUMA S
Citation: A. Torii et al., THE FEASIBILITY OF A PRECISE LINEAR DISPLACEMENT ENCODER USING MULTIPLE PROBE FORCE MICROSCOPE, International journal of the Japan Society for Precision Engineering, 27(4), 1993, pp. 367-372