Authors: OLBRICH T RICHARDSON A VERMEIREN W STRAUBE B

Citation: T. Olbrich et al., INTEGRATING TESTABILITY INTO MICROSYSTEMS, Microsystem technologies, 3(2), 1997, pp. 72-79

Authors: OLBRICH T MOZUELOS R RICHARDSON A BRACHO S

Citation: T. Olbrich et al., DESIGN-FOR-TEST (DFT) STUDY ON A CURRENT-MODE DAC, IEE proceedings. Circuits, devices and systems, 143(6), 1996, pp. 374-379

Authors: OLBRICH T RICHARDSON A

Citation: T. Olbrich et A. Richardson, DESIGN AND SELF-TEST FOR SWITCHED-CURRENT BUILDING-BLOCKS, IEEE design & test of computers, 13(2), 1996, pp. 10-17

Authors: OLBRICH T RICHARDSON AMD BRADLEY DA

Citation: T. Olbrich et al., BUILT-IN SELF-TEST AND DIAGNOSTIC SUPPORT FOR SAFETY-CRITICAL MICROSYSTEMS, Microelectronics and reliability, 36(7-8), 1996, pp. 1125-1136

Authors: BRATT AH OLBRICH T DOREY AP

Citation: Ah. Bratt et al., CLASS AB REGULATED CASCODE CURRENT MEMORY CELL, Electronics Letters, 30(22), 1994, pp. 1821-1822