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Results: 1-20 |
Results: 20
LOW-FREQUENCY AND HIGH-FREQUENCY VIBRATION ISOLATION FOR SCANNING PROBE MICROSCOPY
Authors: OLIVA AI AGUILAR M SOSA V
Citation: Ai. Oliva et al., LOW-FREQUENCY AND HIGH-FREQUENCY VIBRATION ISOLATION FOR SCANNING PROBE MICROSCOPY, Measurement science & technology, 9(3), 1998, pp. 383-390
NUCLEATION AND GROWTH OF SRTIO3 SI(100) OBSERVED BY ATOMIC-FORCE MICROSCOPY/
Authors: CASTRORODRIGUEZ R OLIVA AI AGUILAR M BARTOLOPEREZ P VASCO E LECCABUE F PENAL JL
Citation: R. Castrorodriguez et al., NUCLEATION AND GROWTH OF SRTIO3 SI(100) OBSERVED BY ATOMIC-FORCE MICROSCOPY/, Applied surface science, 125(1), 1998, pp. 58-64
ELECTROMIGRATION IN GOLD THIN-FILMS
Authors: AGUILAR M OLIVA AI QUINTANA P PENA JL
Citation: M. Aguilar et al., ELECTROMIGRATION IN GOLD THIN-FILMS, Thin solid films, 317(1-2), 1998, pp. 189-192
EVIDENCE OF PURE DIFFUSION PROCESS DURING GROWTH OF GOLD-FILMS
Authors: OLIVA AI SACEDON JL ANGUIANO E AGUILAR M AZNAREZ JA MENDEZ JA
Citation: Ai. Oliva et al., EVIDENCE OF PURE DIFFUSION PROCESS DURING GROWTH OF GOLD-FILMS, Surface science, 417(1), 1998, pp. 1139-1142
THE EFFECT OF ELECTRICAL-CURRENT (DC) ON GOLD THIN-FILMS
Authors: AGUILAR M OLIVA AI QUINTANA P
Citation: M. Aguilar et al., THE EFFECT OF ELECTRICAL-CURRENT (DC) ON GOLD THIN-FILMS, Surface science, 409(3), 1998, pp. 501-511
OPTIMAL CONDITIONS FOR IMAGING IN SCANNING-TUNNELING-MICROSCOPY - THEORY
Authors: ANGUIANO E OLIVA AI AGUILAR M
Citation: E. Anguiano et al., OPTIMAL CONDITIONS FOR IMAGING IN SCANNING-TUNNELING-MICROSCOPY - THEORY, Review of scientific instruments, 69(11), 1998, pp. 3867-3874
OPTIMAL CONDITIONS FOR IMAGING IN SCANNING-TUNNELING-MICROSCOPY - EXPERIMENTAL
Authors: ANGUIANO E OLIVA AI AGUILAR M
Citation: E. Anguiano et al., OPTIMAL CONDITIONS FOR IMAGING IN SCANNING-TUNNELING-MICROSCOPY - EXPERIMENTAL, Review of scientific instruments, 69(11), 1998, pp. 3875-3878
OBSERVATION OF MACRO-TERRACES IN CADMIUM TELLURIDE THIN-FILMS
Authors: AGUILAR M OLIVA AI CASTRORODRIGUEZ R PENA JL
Citation: M. Aguilar et al., OBSERVATION OF MACRO-TERRACES IN CADMIUM TELLURIDE THIN-FILMS, Journal of materials science. Materials in electronics, 8(2), 1997, pp. 103-107
EXPERIMENTAL-DETERMINATION OF THE PARAMETERS OF THE FEEDBACK-SYSTEM OF A SCANNING TUNNELING MICROSCOPE
Authors: OLIVA AI AGUILAR M PENA JL ANGUIANO E
Citation: Ai. Oliva et al., EXPERIMENTAL-DETERMINATION OF THE PARAMETERS OF THE FEEDBACK-SYSTEM OF A SCANNING TUNNELING MICROSCOPE, Measurement science & technology, 8(5), 1997, pp. 501-507
NUCLEATION OF STRONTIUM-TITANATE FILMS GROWN BY PLD ON SILICON - A KINETIC-MODEL
Authors: CASTRORODRIGUEZ R VASCO E LECCABUE F WATTS BE ZAPATATORRES M OLIVA AI
Citation: R. Castrorodriguez et al., NUCLEATION OF STRONTIUM-TITANATE FILMS GROWN BY PLD ON SILICON - A KINETIC-MODEL, Thin solid films, 307(1-2), 1997, pp. 306-310
QUASIATOMICALLY FLAT SURFACES OF CDTE GROWTH BY EVAPORATION TECHNIQUE
Authors: AGUILAR M OLIVA AI CASTRORODRIGUEZ R PENA JL
Citation: M. Aguilar et al., QUASIATOMICALLY FLAT SURFACES OF CDTE GROWTH BY EVAPORATION TECHNIQUE, Thin solid films, 293(1-2), 1997, pp. 149-152
DYNAMIC PHENOMENA IN THE SURFACE OF GOLD THIN-FILMS - MACROSCOPIC SURFACE REARRANGEMENTS
Authors: AGUILAR M OLIVA AI QUINTANA P PENA JL
Citation: M. Aguilar et al., DYNAMIC PHENOMENA IN THE SURFACE OF GOLD THIN-FILMS - MACROSCOPIC SURFACE REARRANGEMENTS, Surface science, 380(1), 1997, pp. 91-99
ANALYSIS OF SCANNING-TUNNELING-MICROSCOPY FEEDBACK-SYSTEM - EXPERIMENTAL-DETERMINATION OF PARAMETERS
Authors: ANGUIANO E OLIVA AI AGUILAR M PENA JL
Citation: E. Anguiano et al., ANALYSIS OF SCANNING-TUNNELING-MICROSCOPY FEEDBACK-SYSTEM - EXPERIMENTAL-DETERMINATION OF PARAMETERS, Review of scientific instruments, 67(8), 1996, pp. 2947-2952
ELECTROCHEMICAL PREPARATION OF TUNGSTEN TIPS FOR A SCANNING TUNNELINGMICROSCOPE
Authors: OLIVA AI ROMERO A PENA JL ANGUIANO E AGUILAR M
Citation: Ai. Oliva et al., ELECTROCHEMICAL PREPARATION OF TUNGSTEN TIPS FOR A SCANNING TUNNELINGMICROSCOPE, Review of scientific instruments, 67(5), 1996, pp. 1917-1921
HEAVILY-DOPED CDTE-FILMS GROWN BY CLOSE-SPACED VAPOR TRANSPORT TECHNIQUE COMBINED WITH FREE EVAPORATION
Authors: CASTRORODRIGUEZ R ZAPATATORRES M ZAPATANAVARRO A OLIVA AI PENA JL
Citation: R. Castrorodriguez et al., HEAVILY-DOPED CDTE-FILMS GROWN BY CLOSE-SPACED VAPOR TRANSPORT TECHNIQUE COMBINED WITH FREE EVAPORATION, Journal of applied physics, 79(1), 1996, pp. 184-187
CADMIUM TELLURIDE THIN-FILMS DOPED WITH INDIUM - A MORPHOLOGICAL-STUDY
Authors: OLIVA AI ANGUIANO E AGUILAR M CASTRORODRIGUEZ R PENA JL
Citation: Ai. Oliva et al., CADMIUM TELLURIDE THIN-FILMS DOPED WITH INDIUM - A MORPHOLOGICAL-STUDY, Journal of materials science. Materials in electronics, 6(3), 1995, pp. 154-160
IN-DOPED CDTE-FILMS BY CSVT COMBINED WITH FREE EVAPORATION - MORPHOLOGICAL, STOICHIOMETRIC AND ELECTRICAL STUDIES
Authors: CASTRORODRIGUEZ R CASTELLANOS CR ZAPATATORRES M ZAPATANAVARRO A DELEON JM OLIVA AI PENA JL
Citation: R. Castrorodriguez et al., IN-DOPED CDTE-FILMS BY CSVT COMBINED WITH FREE EVAPORATION - MORPHOLOGICAL, STOICHIOMETRIC AND ELECTRICAL STUDIES, Revista Mexicana de Fisica, 41(3), 1995, pp. 396-407
ANALYSIS OF SCANNING-TUNNELING-MICROSCOPY FEEDBACK-SYSTEM
Authors: OLIVA AI ANGUIANO E DENISENKO N AGUILAR M PENA JL
Citation: Ai. Oliva et al., ANALYSIS OF SCANNING-TUNNELING-MICROSCOPY FEEDBACK-SYSTEM, Review of scientific instruments, 66(5), 1995, pp. 3196-3203
SCANNING TUNNELING MICROSCOPE WITH ATOMIC -RESOLUTION
Authors: OLIVA AI REJON V SALAZAR NL AVILA E KANTUN T CORONA JE PENA JL
Citation: Ai. Oliva et al., SCANNING TUNNELING MICROSCOPE WITH ATOMIC -RESOLUTION, Revista Mexicana de Fisica, 40(1), 1994, pp. 106-118
SIMPLE ROUGH APPROACH SYSTEM FOR SCANNING TUNNELING MICROSCOPE
Authors: OLIVA AI REJON V PENA JL
Citation: Ai. Oliva et al., SIMPLE ROUGH APPROACH SYSTEM FOR SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 65(6), 1994, pp. 2157-2159
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