Authors:
RAWN CJ
KNEER EA
BIRNIE DP
ORR MN
SCHRIMPF RD
TEOWEE G
Citation: Cj. Rawn et al., INFLUENCE OF TI INTERFACIAL LAYERS ON THE ELECTRICAL AND MICROSTRUCTURAL PROPERTIES OF SOL-GEL PREPARED PZT FILMS, Integrated ferroelectrics, 6(1-4), 1995, pp. 111-119
Citation: Cj. Rawn et al., EFFECT OF RUOX BOTTOM ELECTRODE ANNEALING TEMPERATURE ON SOL-GEL DERIVED PZT CAPACITORS, Integrated ferroelectrics, 10(1-4), 1995, pp. 309-318