Authors: HILD R ALTENBURGER U NITZSCHE G WIENECKE J OTHER H

Citation: R. Hild et al., ON THE SIMULATION OF THE IMAGING PROPERTIES OF SPIKE DEFECTS, Optik, 99(2), 1995, pp. 55-61

Authors: NITZSCHE G HILD R ALTENBURGER U OTHER H

Citation: G. Nitzsche et al., OPTICAL-IMAGE PROCESSING - A USEFUL TOOL IN WAFER INSPECTION, Microelectronic engineering, 23(1-4), 1994, pp. 391-394