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Authors: OTTERMANN CR BANGE K

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Authors: SCHMITT W DROTBOHM P ROTHE J HORMES J OTTERMANN CR BANGE K

Citation: W. Schmitt et al., THICKNESS DETERMINATION OF THIN SOLID FILMS BY ANGLE-RESOLVED X-RAY-FLUORESCENCE SPECTROMETRY USING MONOCHROMATIZED SYNCHROTRON-RADIATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 407-411