Authors:
Rangelow, IW
Shi, F
Hudek, P
Grabiec, P
Volland, B
Givargizov, EI
Stepanova, AN
Obolenskaya, LN
Mashkova, ES
Molchanov, VA
Citation: Iw. Rangelow et al., Micromachined ultrasharp silicon and diamond-coated silicon tip as a stable field-emission electron source and a scanning probe microscopy sensor with atomic sharpness, J VAC SCI B, 16(6), 1998, pp. 3185-3191